- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
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Mass Spectrometry for Energy Transformation and Astrochemistry
- BL01-Mass Spectrometry for Energy Transformation and Astrochemistry
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Extreme Ultraviolet Electronic Structure Characterization and Lithography
- BL02: Vacuum-ultraviolet Angle Resolved Photoemission Spectroscopy Beamline
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Electronic Structure Characterization for Operando Micro/Nano Devices
- BL03-Electronic Structure Characterization for Operando Micro/Nano Devices
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High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- BL04-High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
-
In-situ/Operando Soft X-ray Spectroscopy and Scattering
- BL05-In-situ/Operando Soft X-ray Spectroscopy and Scattering
-
High Throughput In-situ/Operando Tender X-ray Spectroscopy
- BL08-High Throughput In-situ/Operando Tender X-ray Spectroscopy
