- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
| BL03 | Electronic Structure Characterization for Operando Micro/Nano Devices |
Energy/eV | 45-1000 |
Advantage | High spatial resolution, spin-resolved, operando measurement of the electronic structure of devices |
Experimental method | SX-ARPES nano-ARPES |
Contact | Jiang Juan (jjiangcindy@ustc.edu.cn) |
