- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
Angle-resolved Photoemission Spectroscopy
The Electronic structure of operando Micro-/Nano-Devices beamline specializes in angle-resolved photoemission spectroscopy (ARPES). Specifically designed with a soft X-ray energy range and a sub-micron to nano-scale beam spot, this beamline excels at probing the electronic structure of buried interfacial states and functional micro-nano devices in operando.