- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
BL05 | In-situ/Operando Soft X-ray Spectroscopy and Scattering |
Energy/eV | 180-2500 |
Advantage | Spatiotemporal resolution and in-situ/operando detection of electronic structure |
Experimental method | NAP-XPS XAS/XES/RIXS |
Contact | Chen Shuangming(csmp@ustc.edu.cn) |
