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Home
About
About Us
Leadership
Departments
Science
Science Areas
Research Techniques
Accelerator Physics
Control, Computing and Data
Optics and Instrumentation
Publications
Annual Reports
Facility
HALF
HLS
FELiChEM
User
Gerenal Information
Apply for Beamtime
Your Experiment
User Committee
Policies
Education & Culture
Oppotunities
Contact Us
Science
Science Areas
Research Techniques
Accelerator Physics
Control, Computing, and Data
Optics and Instrumentation
Publications
Annual Reports
SCIENCE
HEFEI ADVANCED LIGHT FACILITY
Beamline and Endstations
Mass Spectrometry for Energy Transformation and Astrochemistry
Extreme Ultraviolet Electronic Structure Characterization and Lithography
Electronic Structure Characterization for Operando Micro/Nano Devices
High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
In-situ/Operando Soft X-ray Spectroscopy and Scattering
Soft X-ray Ptychographic Nanoscopy
Resonant Coherent Scattering
High Throughput In-situ/Operando Tender X-ray Spectroscopy
Tender X-ray Spectromicroscopy and Ptychography
Test Beamline
HEFEI LIGHT SOURCE
Beamline and Endstations
Mass Spectrometry for Energy Transformation and Astrochemistry
Extreme Ultraviolet Electronic Structure Characterization and Lithography
Electronic Structure Characterization for Operando Micro/Nano Devices
High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
In-situ/Operando Soft X-ray Spectroscopy and Scattering
Soft X-ray Ptychographic Nanoscopy
Resonant Coherent Scattering
High Throughput In-situ/Operando Tender X-ray Spectroscopy
Tender X-ray Spectromicroscopy and Ptychography
Test Beamline
FELiChEM
Experimental Endstation
Photodissociation Spectroscopy (IRFEL-PDS)
Photoexcitation Spectroscopy (IRFEL-PES)
Sum Frequency Generation Spectroscopy (IRFEL-SFG)
Atomic Force Microscopy-Based Spectroscopy (IRFEL-AFM)
Surface/Interface Reflection Absorption Spectroscopy (IRFEL-RAS)