Key Performance

Overview

Branch A is a SX-ARPES endstation with the X-ray beam energy ranging from 45 eV to 1000 eV. Equipped with a DFS30 analyzer from Scientia Omicron and a VLEED spin detector, this endstation is designed to measure both the electronic structure and the spin structure of quantum materials.  

I. Loadlock 

  Up to 20 samples can be loaded (flag-type sample plate)

II. Prepare chamber

  sample can be heated upto 1000 K;

  Argon sputtering;

  6 evaporator positions available once requested;

  ozone cleaning;    

III. Analysis chamber

　gold evaporator; 

    alkali metal doser;

    In-situ 4 electron leads on the sample position for   gating or straining use special designed sample plate;

    absorption spectroscopy measurements.

B-Branch: Nano-ARPES

ZP-Nano-ARPES

Overview

Branch B is a Nano-ARPES endstation. Two optical techniques are used separately to achieve ~ 100 nm beam size: the ZP-nano-ARPES and the KB-nano-ARPES. Both equipped with a DFS30 analyzer from Scientia Omicron. The energy of the zone plate chosen for the ZP-nano-ARPES is 100 eV and 150 eV. And the beam energy accessible for the KB-nano-ARPES is 45 eV~ 300 eV. Except for the optical method, all the other parameters are similar for the two endstations.

I. Loadlock 

  up to 12 samples can be loaded (flag-type sample plate)

II. Transfer chamber

  sample can be heated upto 1000 K;

  Argon sputtering;

  alkali metal doser;

  2 evaporator positions available once requested;  

III. Analysis chamber

  in situ 4 electron leads on the sample position for gating or straining use special designed sample plate;

Key Performance