- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
Related beamlines:
TEST beamlines:
https://ssrf.sari.ac.cn/dkxzz/tbfs/gsxz_gb/xzdl_tbfs/bl09b/xzjs/
https://english.ihep.cas.cn/heps/fa/bl/202112/t20211222_295080.html