- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
Related beamlines:
XMCD beamlines:
https://www.nsrl.ustc.edu.cn/10957/list.htm
https://www.helmholtz-berlin.de/pubbin/igama_output?modus=einzel&sprache=en&gid=1969&typoid=76454
PEEM beamlines:
https://www.maxiv.lu.se/beamlines-accelerators/beamlines/maxpeem/
https://sites.google.com/lbl.gov/bl11-peem3-als/home