High flux tender in-situ/operando X-ray spectroscopy beamline specializes in (ambient pressure) X-ray photoelectron spectroscopy (XPS/APXPS) and X-ray absorption/Emission spectroscopy (XAS/XES). Specifically designed with a tender X-ray energy range and a milli- to the micro-scale beam spot, this beamline focuses on in-situ/operando characterization of dynamic interfaces under real working conditions in batteries, catalysis, chips, and other devices.