Key Performance

Overview

The Tender X-ray  Microscopic Spectral Imaging beamline has two imaging systems, ptychography and full-field TXM system, which can carry out three-dimensional nanostructure imaging and spectroscopic imaging.

I. Sample Loader and Gripper

Up to 4 samples can be loaded at a time and maintained in a cryogenic state

II. Ptychography System

Hybrid photon counting X-ray detectors;

High-resolution lensless scanning imaging

III. Full-field Transmission X-ray Microscopy System

Scintillator optically coupled to a dedicated sCMOS;

3D nanostructure imaging and spectroscopic imaging base on X-ray optics such as zone plate