- Mass Spectrometry for Energy Transformation and Astrochemistry
- Extreme Ultraviolet Electronic Structure Characterization and Lithography
- Electronic Structure Characterization for Operando Micro/Nano Devices
- High-sensitive, Space-Resolved and Time-Resolved Electron Spin Dynamics
- In-situ/Operando Soft X-ray Spectroscopy and Scattering
- Soft X-ray Ptychographic Nanoscopy
- Resonant Coherent Scattering
- High Throughput In-situ/Operando Tender X-ray Spectroscopy
- Tender X-ray Spectromicroscopy and Ptychography
- Test Beamline
Key Performance
Overview
An endstation designed for soft X-ray spectro-nanoscopy, integrates multiple techniques and operational modes, incorporating piezoelectric stages and a laser interferometer.
Techniques: Ptychography, STXM, LE-XRF
Operation modes: 2D/3D imaging; TEM compatible 3D cryogenic imaging
Detectors: sCMOS, PD/APD, 4 channel-SDD, channeltron