Characterization of thin films by XAFS: application to spintronics materials
| Speaker: | Prof. Steven Michael Heald, Advanced Photon Source, USA |
| Time: | 2016-5-27 10:45 |
| Place: | 3# 210 Meeting Room, National Synchrotron Radiation Laboratory |
| Detail: | Education Record: 1972, University of Washington,Seattle WA– B. S. Physics 1973, University of Illinois, Urbana IL– M. S. Physics 1976, University of Illinois, Urbana IL– Ph. D. Physics Research and Work Experience: 1972–1976, Teaching Assistant, Research Assistant, University of Illinois, Designed and built a dilution refrigerator based x-ray diffraction cryostat. 1976–1979, Research Associate, University of Washington, As a post-doc with Prof. Ed Stern, he participated in the development of the modern methods of EXAFS experimental and analytical techniques. 1979–1981, Assistant Physicist; 1981–1983, Associate Physicist; 1983–1993, Physicist; 1993received tenure, Brookhaven National Laboratory, Oversee the development of the sector X-11 beamlines at the NSLS. design for beamline X-11A; Group leader of the surface and interface program in the Materials Science Department. 1993-2006, Staff Scientist V, Pacific Northwest National Laboratory, Technical lead for the PNC-CAT project; Led the construction of two beamlines at Sector 20 of the APS. 2006-present, Spectroscopy Group Leader, Senior Physicist, Argonne National Laboratory, APS Spectroscopy Group Leader, X-ray Science Division. Research Interests: Improving the instrumentation for experiments (the engineering side of science), as well as applying advanced techniques to problems in materials and environmental science. Publications: More than 210 refereed publications, 8 book chapters, and two patents. h-index 59, i10-index |
| Organizer: | National Synchrotron Radiation Laboratory |
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