Abstract:

The presentation in my talk will focus on the use of synchrotron-radiation-based microscopic and spectroscopic techniques for probing the electronic structures of nano- materials. Specifically, the works have been involved with using x-ray absorption spectroscopy (XAS), x-ray emission spectroscopy (XES)/resonance inelastic x-ray scattering (RIXS), scanning transmission x-ray microscopy (STXM), x-ray excited optical luminescence (XEOL) and x-ray magnetic circular dichroism (XMCD) to study low-dimensional nanomaterials (BN-doped graphene/graphene oxides, nitrogen-functionalized graphene nano flakes and ZnO nanomaterials).