Speaker: | Dr. Yijin Liu, SLAC National Accelerator Laboratory, USA |
Time: | 2015-11-02 10:00 |
Place: | 3# 210, National Synchrotron Radiation Laboratory |
Detail: |
Abstract: X-ray microscopy offers several different imaging modalities, such as full-field X-ray microscopy, scanning X-ray microscopy, and coherent-based X-ray microscopy. These imaging modalities probe structural and chemical information at different scales ranging from macro-, micro-, meso-, to nano- scales, depending on the X-ray optics used and the configuration of the imaging systems. The pros and cons (in resolving power, sensitivity, data acquisition speed, contrast mechanisms, etc.) of each individual X-ray imaging method naturally make the case that correlative imaging is powerful and beneficial for scientific studies. C.V.: Yijin Liu received a PhD degree in Optics from University of Science & Technology of China in 2009. He joined Stanford Synchrotron Radiation Lightsource of the SLAC National Accelerator Laboratory (Menlo Park, CA) as a postdoctoral scholar in the same year and became a staff scientist in 2012. He is currently leading the Transmission X-ray Microscopy program at SSRL. Liu has 10 years of experience in X-ray microscopy at multiple length scales using both synchrotrons and compact laboratory X-ray sources. In addition to his expertise in methodology of X-ray microscopy, his scientific research focuses on the fields of functional material science and geoscience. He has published more than 50 peer-reviewed scientific manuscripts, many in top tier research journals such as Nature Energy, Nature Geoscience, Nature Scientific Reports, Science Advances, Nano Letter, JACS, PNAS, Advanced Energy Materials, Angewandte Chemie. |
Organizer: | National Synchrotron Radiation Laboratory |